CIF TEM Plasma Cleaner (CIF-TEM)

Category： Plasma Cleaners

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Surface Modification

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Photoresist Removal

Plasma Strippers

Etching

Plasma Etchers

Coating

Gel Driers Spin Coaters Plasma Sputtering Coaters

Product Parameters

The CIF transmission electron microscope (TEM) sample holder cleaning system features a remote ion source design, enabling rapid and efficient removal of hydrocarbon contaminants with minimal bombardment damage, while maintaining compatibility with conventional plasma cleaning methods. This system is specifically engineered for the decontamination of TEM and scanning electron microscope (SEM) samples and their corresponding holders.

Attribute: Product Name; Model; Manufacturer Nature; Visits; Time

Details: CIF TEM Plasma Cleaner (CIF-TEM); CIF-TEM; Manufacturer; 381次; 2024-03-18

Products Details

Function & Features

1. Remote Ion Cleaning Source: Equipped with a remote ion cleaning source to deliver efficient cleaning without damaging samples.

2. Dual-Mode Versatility: Compatible with standard plasma cleaning mode, accommodating various samples and diverse cleaning requirements.

3. Universal SEM/TEM Compatibility:Compatible with sample holders of international mainstream TEM/SEM from Thermo Fisher, Hitachi, JEOL and other brands.

4. Precise Gas Path & Vacuum System: Adopts dual-channel MFC automatic flow control and molecular pump unit, featuring high ultimate vacuum and stable operation.

5. Intelligent Touch Control: 7-inch full-color touch screen with Chinese/English bilingual switch. Adjustable parameters for simple and intuitive operation.

6. Comprehensive After-sales Support: 2-year warranty and lifelong maintenance service available.