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CIF TEM sample holder cleaning machine

Category： Plasma Cleaners
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Surface Modification
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Product Parameters

CIF Transmission Electron Microscope (TEM) Sample Holder Cleaner adopts remote ion cleaning source design, which is fast and efficient, with low bombardment damage, and can also achieve conventional plasma cleaning. It is mainly used for plasma cleaning and vacuum leak detection of TEM transmission electron microscope sample holders.
Attribute
Product Name
Model
Manufacturer Nature
Visits
Time
Details
CIF TEM sample holder cleaning machine
CIF-TEM
Manufacturer
50次
2024-03-18

Products Details

Product Features


◆ Remote ion cleaning source


◆ One machine for multiple uses


◆ Fast and efficient cleaning, low bombardment damage

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