CIF Remote SEM Plasma Cleaner (CIF-SEM)

Category： Plasma Cleaners

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Surface Modification

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Product Parameters

The CIF scanning electron microscope (SEM) plasma cleaner employs a remote plasma cleaning source, enabling efficient and rapid removal of contaminants while significantly minimizing potential damage to sensitive samples. This system is primarily designed to eliminate hydrocarbon contamination from the vacuum chambers and sample surfaces of SEM, FIB, and other related instrumentation.Compatible with mainstream electron microscope Bbrands both domestically and internationally, it helps maintain optimal equipment performance and imaging quality.

Attribute: Product Name; Model; Manufacturer Nature; Visits; Time

Details: CIF Remote SEM Plasma Cleaner (CIF-SEM); CIF-SEM; Manufacturer; 913次; 2024-03-19

Products Details

Function & Features

1. Remote Plasma Source: Equipped with remote ion cleaning source to achieve efficient and damage-free cleaning, greatly reducing damage caused by direct bombardment.

2. Efficient & Rapid Cleaning: Quickly removes hydrocarbon contaminants and shortens processing time effectively.

3. Wide Compatibility with Multiple Brands: Compatible with mainstream SEMs at home and abroad, including Thermo Fisher, Hitachi, JEOL and more.

4. Intelligent Precision Gas Control: Dual-channel MFC for stable gas flow; multiple process gas options available.

5. Intelligent Touch Operation: 7-inch full-color touch screen with Chinese/English bilingual switching. Adjustable parameters for simple and intuitive operation.

6. Comprehensive After-sales Service: 2-year warranty and lifetime maintenance service.